Opto-Edu (Beijing) Co., Ltd.
Opto-Edu (Beijing) Co., Ltd.
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♦Afforadable SEM
♦English Operation Panel
♦Full set of automated software
♦Modification Service Available
♦Bestseller SEM
Scanning electron microscopy (sem) is suitable for the observation of the surface topography of metals, ceramics, semiconductors, minerals, biology, polymers, composites and nano-scale one-dimensional, two-dimensional and three-dimensional materials (secondary electron image, backscattered electron image).It can be used to analyze the point, line and surface components of microregion.It is widely used in petroleum, geology, mineral field, electronics, semiconductor field, medicine, biology field, chemical industry, polymer material field, criminal investigation of public security, agriculture, forestry and other fields.
| A63.7062 Eco Tungsten Filament SEM | ||
| Resolution | 4.5nm@30KV(SE); 6nm@30KV(BSE) | |
| Magnification | Negative Magnification: 15x~250000x; Screen Magnification: 30x~500000x | |
| Electron Gun | Tungsten Heated Cathode-Pre Centered Tungsten Filament Cartridge | |
| Accelerating Voltage | 0~30KV | |
| Lens System | Three-level Electromagnetic Lens (Tapered Lens) | |
| Objective Aperture | Molybdenum Aperture Adjustable Outside Vacuum System | |
| Specimen Stage | Five Axes Stage | |
| Travel Range | X(Auto) | 0~50mm |
| Y(Auto) | 0~50mm | |
| Z(Manual) | 0~25mm | |
| R(Manual) | 360º | |
| T(Manual) | -5º~90º | |
| Max Specimen Diameter | 150mm | |
| Detector | High Vacuum Secondary Electron Detector (With Detector Protection) | |
| Modification | Stage Upgrade;EBL;STM;AFM;Heating Stage;Cryo Stage;Tensile Stage;Micro-nano Manipulator;SEM+Coating Machine;SEM+Laser | |
| Accessories | CCD,LaB6,X-Ray Detector(EDS),EBSD,CL,WDS,Coating Machine | |
| Vacuum System | Turbo Molecular Pumps;Rotation Pump | |
| Electron Beam Current | 10pAt~0.1μA | |
| PC | Customized Dell Work Station | |
Tungsten Heated Cathode-Pre Centered Tungsten Filament Cartridge
The Electromagnetic Lens In This Cylinder
The Isolating Valve Ensures That The Upper Vacuum Is Not Affected When The Sample Room Is Opened
Objective Aperture
The Sample To Be Observed Need To Put IN The Sample Room
Five Axes Stage, X/Y Motorized Control (Small)
| Consumables | ||||
| Name | Specification | Quantity | Unit | |
| 1 | Centered cartridge filament | 5 | set | |
| 2 | Specimen cup | (φ13) | 10 | pcs |
| 3 | Specimen cup | (φ32) | 10 | pcs |
| 4 | Carbon conductive tape(double side) | 6mm | 1 | pc |
| 5 | Vacuum grease | 1 | Bottle | |
| 6 | Lint-free cloth | 20 | pcs | |
| 7 | Vent-pipe | 5 | meter | |
| 8 | Polishing paste | 1 | set | |
| Tools | ||||
| Name | Quantity | Unit | ||
| 1 | Allen wrench | 1 | set | |
| 2 | Clean stick | 1 | pc | |
| 3 | Overshot | 1 | pc | |
| 4 | Aperture removing tool | 1 | pc | |
| 5 | Tweezers | 1 | pc | |
| 6 | Screwdriver | 2 | pcs | |
High Vacuum Secondary Electron Detector
Optional Accessory Connection Interface
A63.7062 Support Three Window Synchronous, Two Chanel (SE+BSE) With CCD Window; Image Resolution: 4096*4096 Pixels